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Vortez Hardware - PC Hardware News and Reviews » Articles » CeBIT 2010 - GeIL EVO Cyclone and DBT » Page 1


CeBIT 2010 - GeIL EVO Cyclone and DBT

Posted by: David Mitchelson (Mishima) on: 03/03/2010 05:54 PM [ Print | 3 comment(s) ]



GeIL had an impressive booth over at CeBIT this year. Two of the items that took my attention specifically were:

EVO Cyclone Memory Cooler
The GeIL Cyclone Memory Cooler was on display and immediately grabs your attention. This is the worlds first memory cooler with LED display that gives you crtical information such as the RPM of the fan included but more importantly the temperatures of the modules. This is the first generation of such a product, and GeIL are hoping to release their next Cyclone cooler in time for Computex in June.





DBT
GeIL also had a nice working demonstration of their DBT testing. DBT or Die-hard Burn-in Technology is a method in which GeIL can stress the memory modules before shipping out from the factory it forces weaker chips to fail and allows for a GeIL to be ahead of other companies - sending out considerably less faulty products

The conventional way of stress testing memory modules would have you test for something like 20 minutes under room temperature and would require someone to be observing the results obtained. With DBT this is now eliminated and improves memory quality being shipped out significantly.

GeIL have a chamber in one of their labs that tests up to 1000 modules simultaneously, using GeIL's custom-made boards. Tests are conducted for massive amounts of time and this puts GeIL ahead of the competition with regards to QC. So look out for the DBT stamp on your memory, if it has one it means its rock solid!



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